HIOKI Wideband Current Probes – Leading the Way for Decades
Capture Fast Current Waveforms with precision
- Wideband current probes up to 30 A
For high-speed waveform analysis of small to medium currents, from fine signal changes to transient current peaks. - High-current oscilloscope probes up to 500 A
Fluxgate-based probes for higher AC/DC currents, combining wide bandwidth, fast rise time, and stable operation at high temperatures.
CT6705 HIOKI AC/DC Fluxgate Current Probe, 500 A / 15 MHz
HIOKI CT6711 - AC/DC multi-range Current Probe, 30 A / 120 MHz
HIOKI CT6701 - AC/DC Current Probe, 5 A / 120 MHz
HIOKI 3276 - AC/DC Current Probe, 30 A / 100 MHz
HIOKI CT6700 - AC/DC Current Probe, 5 A / 50 MHz
HIOKI CT6710 - AC/DC multi-range current probe, 30 A / 50 MHz
HIOKI 3273-50 - AC/DC Current Probe, 30 A / 50 MHz
HIOKI CT6704 - AC/DC Fluxgate Current Probe, 200 A / 30 MHz
HIOKI 3269 - Power Supply for Current Probes, 2500 mA
HIOKI 3272 - Power Supply for Current Probes, 600 mA
HIOKI Z5021 - Power supply unit for current or differential probes, factory option for MR6000
HIOKI 3275 - AC/ DC Current Probe, 500 A / 2 MHz
Which Wideband Current Probe Fits Your Measurement?
When selecting a suitable current probe, the key parameters to consider are current range, bandwidth, rise time, and sensing method. Fast rise time and sufficient bandwidth are key for steep switching edges, while the right current range and high signal fidelity help evaluate small variations. For high-current applications, fluxgate sensing technology supports stable operation.
All key parameters across the HIOKI wideband current probe range:
| Model | Rated current / ranges | Bandwidth | Rise time | Max. conductor diameter | Sensing method | Suitable power supplies |
|---|---|---|---|---|---|---|
| CT6711 | 0.5 / 5 / 30 A | DC – 120 MHz | ≤ 2.9 ns | Ø 5 mm | Hall element | 3269 |
| CT6710 | 0.5 / 5 / 30 A | DC – 50 MHz | ≤ 7.0 ns | Ø 5 mm | Hall element | 3269 |
| CT6701 | 5 A | DC – 120 MHz | ≤ 2.9 ns | Ø 5 mm | Hall element | 3269, 3272 |
| CT6700 | 5 A | DC – 50 MHz | ≤ 7.0 ns | Ø 5 mm | Hall element | 3269, 3272 |
| 3276 | 30 A | DC – 100 MHz | ≤ 3.5 ns | Ø 5 mm | Hall element | 3269, 3272 |
| 3273-50 | 30 A | DC – 50 MHz | ≤ 7.0 ns | Ø 5 mm | Hall element | 3269, 3272 |
| CT6704 | 200 A | DC – 30 MHz | ≤ 11.6 ns | Ø 20 mm | Fluxgate | 3269 |
| CT6705 | 500 A | DC – 15 MHz | ≤ 23.3 ns | Ø 20 mm | Fluxgate | 3269 |
From Low-Current Detail to Transient Peaks
HIOKI’s Hall element current probes up to 30 A are designed for precise AC/DC current waveform analysis with bandwidths up to 120 MHz. They help capture fast switching behavior, transient currents, and small signal changes in power electronics, semiconductor testing, and mobility applications.
With three selectable current ranges – 500 mA, 5 A, and 30 A – Current Probes CT6711 (120 MHz) and CT6710 (50 MHz) offer flexible use across different applications covering both low-current details and larger transient peaks in a single probe.
Dedicated to 5 A waveform analysis, Current Probes CT6701 (120 MHz) and CT6700 (50 MHz) provide the bandwidth and signal fidelity needed to evaluate semiconductor behavior, switching power supplies, and low-current R&D signals.
For measurements up to 30 A, Current Probes 3276 (100 MHz) and 3273-50 (50 MHz) are suitable for capturing fast transients in inverter circuits, power converters, industrial electronics, and mobility applications.
| Model | Rated current / ranges | Bandwidth | Rise time | Max. conductor diameter | Sensing method | Suitable power supplies |
|---|---|---|---|---|---|---|
| CT6711 | 0.5 / 5 / 30 A | DC – 120 MHz | ≤ 2.9 ns | Ø 5 mm | Hall element | 3269 |
| CT6710 | 0.5 / 5 / 30 A | DC – 50 MHz | ≤ 7.0 ns | Ø 5 mm | Hall element | 3269 |
| CT6701 | 5 A | DC – 120 MHz | ≤ 2.9 ns | Ø 5 mm | Hall element | 3269, 3272 |
| CT6700 | 5 A | DC – 50 MHz | ≤ 7.0 ns | Ø 5 mm | Hall element | 3269, 3272 |
| 3276 | 30 A | DC – 100 MHz | ≤ 3.5 ns | Ø 5 mm | Hall element | 3269, 3272 |
| 3273-50 | 30 A | DC – 50 MHz | ≤ 7.0 ns | Ø 5 mm | Hall element | 3269, 3272 |
High-Current Fluxgate Current Probes: CT6705 & CT6704
The Current Probes CT6704 and CT6705 are designed for stable operation when analyzing fast-changing, high-current waveforms on an oscilloscope. Based on fluxgate sensing technology, both sensors enable stable measurements stable, even when capturing dynamic high-current signals in varying environmental conditions.
CT6704 is designed for faster measurements up to 200 A, while CT6705 covers higher-current testing up to 500 A. Both fit demanding power electronics work, from inverter and converter testing to SiC/GaN-based power semiconductors and high-current R&D.
Key Features
- AC/DC Currents up to 500 A (CT6705) | 200 A (CT6704)
- Frequency bandwidth: DC to 15 MHz (CT6705) | DC to 30 MHz (CT6704)
- Max conductor diameter: 20 mm
- Operating temperature range: -10°C to +50°C
- Accuracy: ±0.5 % rdg. ±1 mV
Stable High-Current Waveform Measurement for Fast Power Electronics
Discover how HIOKI CT6704 and CT6705 AC/DC Current Probes help engineers capture fast, high-current waveforms with confidence. Fluxgate sensing, wide bandwidth, stable zero baseline, and standard BNC output make them ideal for oscilloscope-based current measurement in modern power electronics.
Connection is Everything: Reliable Data Transfer with BNC
No matter which model you choose: All HIOKI wideband current probes feature standard BNC output and connect effortlessly to any oscilloscope and data acquisition system for precise and reliable current measurements.
Their high-impedance signal output supports accurate waveform analysis across a wide frequency range without the need for additional signal conditioning ensuring unmatched versatility across test environments.
Power Supplies & Converters (from mA to high A levels)
Optimize switching and linear power supplies, inverters, and converters with high-speed current analysis.
Semiconductor Testing (from µA to mid A ranges)
Capture precise current behavior in SCRs, IGBTs, MOSFETs, CMOS, and BJTs for efficiency and reliability
Industrial & Consumer Electronics (from mA to tens of A)
Ensure stable current flow and power integrity in high-speed electronic systems.
Mobile Communications (from µA to lower A)
Analyze RF amplifiers, satellite systems, and relay station power circuits for signal stability.
Motor Drives & Mobility Systems (from A levels to several hundred of A)
Monitor EVs, electric trains, avionics, and industrial motor drives for precise energy control and efficiency optimization.
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