HIOKI’s LCR meters and impedance analyzers cover a wide range of applications in R&D, production, and quality control, from electrochemical impedance spectroscopy and measurements of capacitors, inductors, and transformers to SMD component testing at RF frequencies.
Fast measurement times, sweep functions, and comparator/BIN capabilities support both laboratory use and automated production environments, with all instruments designed and manufactured in Japan.
Select your instrument, from electrochemical to RF, and everything in between.
HIOKI IM3536 benchtop LCR meter for high-accuracy impedance, inductance and capacitance measurements from 4 Hz to 8 MHz. Robust design for lab and production. Order now from HIOKI Europe.
Component tester (L, C, R) for production lines with fast measuring time (2ms at 1kHz), measuring frequency from DC and 40Hz to 200kHz with a basic accuracy of 0.05%.
The IM3533-01 is a versatile benchtop LCR meter for precise testing in R&D and production. It measures inductors, capacitors, and resistors, and offers transformer analysis including turn ratio and mutual inductance.
HIOKI IM3570 impedance analyzer for high-precision impedance, inductance and capacitance measurements from 4 Hz to 5 MHz – ideal for lab, R&D and production use. Order now from HIOKI Europe.
The IM3533 was developed for R&D and use in the production of winding goods, transformers and passive components and, with a measurement time of 1 ms in fast mode, is ideal for production lines that require fast measurement times.
The IM3590 Chemical Impedance Analyzer is designed for precise measurement of electrochemical components and materials, including batteries and electric double-layer capacitors (EDLCs).
Key SpecificationsMeasurement frequency: 4 Hz to 5 MHz Equivalent Circuit Analysis: 5 circuit models Basic accuracy: Z: ±0.08%, θ: ±0.05° Guaranteed accuracy range: 1 mΩ to 200 MΩ Test signal levels: 5 mV to 5 V, 10 µA to 100 mA Typical ApplicationsDetailed impedance and frequency response analysis of capacitors, inductors, and resistors in R&D Characterization of piezoelectric components and resonant circuits using equivalent circuit models Evaluation of electrochemical and dielectric properties through Nyquist and admittance plots Investigation of material behavior and complex impedance under varying test signal conditions
Detailed Product OverviewThe HIOKI IM3570-9000 combines the precision of an LCR meter with the advanced analysis functions of an impedance analyzer. It features built-in equivalent circuit analysis and covers a frequency range from 4 Hz to 5 MHz, enabling detailed evaluation of components and materials with frequency-dependent impedance. With measurement speeds as fast as 0.5 ms at 100 kHz, a basic impedance accuracy of ±0.08%, phase accuracy of ±0.05°, and guaranteed accuracy from 1 mΩ to 200 MΩ, the IM3570-9000 provides precise and reliable measurements across a wide impedance range. Versatile and Easy to Use
The instrument supports multiple modes including LCR, which is capable of simultaneously measuring DC resistance, sweep, and continuous measurement. Functions such as comparator and BIN judgments, along with frequency and level sweeps, make it suitable for both automated test systems and laboratory evaluation. The 5.7″ color TFT touchscreen simplifies operation and allows intuitive adjustment of measurement conditions. Interfaces including USB, LAN, RS-232C, GP-IB, and handler I/O provide flexible connectivity for system integration.Equivalent Circuit Analysis included
The IM3570-9000 features built-in equivalent circuit analysis for in-depth evaluation of complex impedance characteristics. The firmware provides five representative circuit models and can automatically select the most suitable one based on the measurement data. In addition to basic three-element R-L-C models, it also supports a four-element model optimized for piezoelectric device analysis. The instrument can display Nyquist (Cole-Cole) and admittance plots directly, offering valuable insight into frequency-dependent behavior and material properties. Flexible Fixture Ecosystem
A wide range of fixtures enable stable and repeatable connections to different device types. Options include Kelvin clip leads for standard components, direct-connection test fixture for stable measurement of leaded components, and SMD test probes for small surface-mount devices. This fixture ecosystem ensures that the IM3570-9000 can be adapted to the requirements of both development labs and automated production environments. Designed and manufactured in Japan, the IM3570-9000 combines reliable measurement performance with long-term stability, making it a versatile instrument for both R&D and production lines.
The IM9905 calibration kit provides OPEN, SHORT and LOAD standards for calibration of
HIOKI impedance analyzers with two-terminal measurement capability at the 7 mm (APC-7)
reference plane. These standards are used to correct systematic measurement errors in the
measurement path up to this reference plane. For calibration of impedance measurement systems, the 7 mm (APC-7) reference plane is
commonly applied in high-frequency metrology. When calibration is performed on systems
with a 3.5 mm test head, such as those of the HIOKI IM7587, IM7585, IM7583 or IM7581, a
suitable adapter is required to establish the 7 mm reference plane. The adapter provided by
HIOKI for this purpose is the IM9906.
The IM9201 SMD test fixture is designed for impedance measurements of surface-mount
components (SMD) in combination with HIOKI impedance analyzers that support twoterminal measurement configurations. It supports measurements up to 3 GHz and
accommodates SMD component sizes from EIA0201 to EIA1210.The IM9201 supports measurements up to 3 GHz, which aligns with the frequency range of
high-frequency impedance analyzers such as the IM7587 and IM7585. The test fixture can
also be used with impedance analyzers featuring lower maximum measurement frequencies,
such as the IM7583 or IM7581, when measurements of small SMD component sizes below
EIA0603 are required.For stable operation, the IM9201 is mounted on the IM9200 stand, which provides a secure
base and defined mechanical alignment between the analyzer test head and the test fixture.
Handling of small SMD components is further facilitated by the magnifier supplied with the
IM9200 stand. Electrical connection to the analyzer test head is performed via the 7 mm
interface of the test fixture. The IM9906 adapter is required to connect the 7 mm interface of
the test fixture to the analyzer test head’s 3.5 mm connector. The IM9201 is supplied with a carrying case designed for storage and transport of the test
fixture and its included accessories. The carrying case also provides dedicated space for
optional accessories such as the IM9906 adapter and IM9905 calibration standards, allowing
related components to be stored together when required.
The IM9200 is a stand for the impedance test fixtures IM9201 and IM9202. It provides a
stable mechanical base and a defined alignment between the analyzer test head and the
mounted test fixture. Handling of small components during setup and measurement is supported by the removable
magnifier supplied with the IM9200. When not in use, the magnifier can be stored in the
carrying case of the test fixture.
Key SpecificationsMeasurement frequency: 1 MHz to 3 GHz Typical analog measurement time: 0.5 msBasic accuracy: ±0.65% (Z, reading), ±0.38°(Phase) Typical repeatability: ±0.07% (e.g., 1 nH at 3 GHz) Test signal levels: −40.0 dBm to +1.0 dBm Typical ApplicationsR&D characterization of RF components such as chip inductors, ferrite beads, filters,
resonators and piezoelectric devices Frequency-dependent impedance analysis for component and circuit design Resonance and peak evaluation of piezoelectric and RF components Automated pass/fail testing of high-frequency components in R&D and production
environments
Models in comparison
Model
Measurement frequency
Test signal levels
IM7587
1 MHz bis 3 GHz
−40,0 dBm bis +1,0 dBm
IM7585
1 MHz bis 1,3 GHz
−40,0 dBm bis +1,0 dBm
IM7583
1 MHz bis 600 MHz
−40,0 dBm bis +1,0 dBm
IM7581
100 kHz bis 300 MHz
−40,0 dBm bis +7,0 dBm
Detailed Product OverviewImpedance measurements up to 3 GHz enable analysis of RF components, for example in
wireless communication applications. With a frequency range from 1 MHz to 3 GHz, the
IM7587 supports characterization of components such as chip inductors, ferrite beads, filters,
resonators and matching networks in RF circuit design. Measurement Performance and Analysis Functions
With a basic accuracy of ±0.65% of impedance and ±0.38° of phase, the IM7587 is designed
for precise impedance measurements up to 3 GHz. Typical repeatability of approximately
±0.07% supports reproducible measurement results under defined conditions across its
entire frequency range. A typical measurement time of 0.5 ms enables fast frequency sweeps
without compromising measurement stability. Test signal levels from −40.0 dBm to +1.0 dBm
enable controlled excitation of devices under test. The analyzer supports LCR, sweep and continuous measurement modes and provides
evaluation functions such as comparator and BIN judgment, as well as area, peak and spot
analysis. All measurement settings and analysis functions are accessed directly via the
integrated 8.4 inch color touchscreen. Standard interfaces include USB, LAN and EXT I/O,
with optional RS-232C and GP-IB. For more advanced analysis, the IM7587 features an Equivalent Circuit Analysis function
with five representative circuit models and automatic model selection based on measurement
data. In addition to three-element R-L-C models, it also supports a four-element model
designed for piezoelectric device analysis, enabling applications ranging from general
component characterization to resonator evaluation. Test Head and Fixtures
The IM7587 employs a compact, palm-sized test head connected to the main unit by a
specified connection cable. It is available with 1 m or 2 m cable lengths, allowing users to
balance measurement accuracy and installation flexibility. Placing the test head close to the
device under test minimizes signal path length and reduces parasitic inductance and
capacitance that would otherwise affect high-frequency measurements. This design supports
stable and reproducible results up to 3 GHz while reducing bench space requirements in RF
laboratories. For measurements of SMD components, the IM7587 is typically used in combination with the
IM9201 SMD test fixture. The IM9201 is designed for six standard SMD package sizes from
0201 to 1210 and provides stable two-terminal bottom contacts at the component interface.
The contact geometry is designed for measurements across the entire specified
measurement frequency range. Components are positioned on defined contact pads using a
stopper and pusher mechanism, ensuring correct alignment and repeatable placement. This
reduces measurement variation and enables precise characterization of SMD RF
components such as chip inductors, ferrite beads and filters. For stable mounting, the IM9201 test fixture is installed on the IM9200 test fixture stand. The
stand provides a secure base and a defined mechanical alignment between the test head
and the fixture and includes a magnifier to facilitate handling of small components. The
IM9906 adapter is required to connect the 7 mm interface of the test fixture to the analyzer
test head’s 3.5 mm connector. Calibration and Measurement Integrity
The optional IM9905 calibration kit provides OPEN, SHORT and LOAD reference standards
for correction of system-related measurement errors in high-frequency impedance
measurements up to 3 GHz. The calibration compensates parasitic effects in the
measurement path up to the defined reference plane, including the analyzer test head and
connecting interfaces. The calibration standards are connected via the same IM9906 adapter
used for test fixtures. Comprehensive contact check functions, including DCR testing, Hi-Z reject and waveform
verification, are used to verify contact quality before and, if required, after measurement. This
helps prevent invalid results caused by insufficient probe contact or unstable component
placement. Developed and manufactured in Japan, the IM7587 is designed for stable
measurement performance over time in measurement and test environments with high
demands on long-term stability.