HIOKI IM9902 - CONTACT TIPS

HIOKI IM3536 benchtop LCR meter for high-accuracy impedance, inductance and capacitance measurements from 4 Hz to 8 MHz. Robust design for lab and production. Order now from HIOKI Europe.

Optional HIOKI RS-232C interface card for installation in the HIOKI impedance measuring instruments IM3523, IM3533, IM3533-01, IM3590, IM7580A, IM7581, IM7583, IM7585, and IM7587.

HIOKI IM3570 impedance analyzer for high-precision impedance, inductance and capacitance measurements from 4 Hz to 5 MHz – ideal for lab, R&D and production use. Order now from HIOKI Europe.

The IM3590 Chemical Impedance Analyzer is designed for precise measurement of electrochemical components and materials, including batteries and electric double-layer capacitors (EDLCs).

The IM9905 calibration kit provides OPEN, SHORT and LOAD standards for calibration of HIOKI impedance analyzers with two-terminal measurement capability at the 7 mm (APC-7) reference plane. These standards are used to correct systematic measurement errors in the measurement path up to this reference plane. For calibration of impedance measurement systems, the 7 mm (APC-7) reference plane is commonly applied in high-frequency metrology. When calibration is performed on systems with a 3.5 mm test head, such as those of the HIOKI IM7587, IM7585, IM7583 or IM7581, a suitable adapter is required to establish the 7 mm reference plane. The adapter provided by HIOKI for this purpose is the IM9906.

The IM9906 adapter features a 7 mm (APC-7) connection on one side and a 3.5 mm male connector on the other side. It is used to connect 7 mm calibration standards or test fixtures to measurement systems with a 3.5 mm test head, including HIOKI impedance analyzers such as the IM7587, IM7585, IM7583 and IM7581. The 7 mm (APC-7) interface is commonly used in high-frequency metrology for calibration standards and impedance test fixtures. The 3.5 mm interface is a precision coaxial connector used for RF and impedance measurements and is mechanically compatible with SMA connectors, but differs in construction by using an air dielectric instead of a solid dielectric.

Key SpecificationsMeasurement frequency: 1 MHz to 3 GHz Typical analog measurement time: 0.5 msBasic accuracy: ±0.65% (Z, reading), ±0.38°(Phase) Typical repeatability: ±0.07% (e.g., 1 nH at 3 GHz) Test signal levels: −40.0 dBm to +1.0 dBm Typical ApplicationsR&D characterization of RF components such as chip inductors, ferrite beads, filters, resonators and piezoelectric devices Frequency-dependent impedance analysis for component and circuit design Resonance and peak evaluation of piezoelectric and RF components Automated pass/fail testing of high-frequency components in R&D and production environments  Models in comparison Model Measurement frequency Test signal levels IM7587 1 MHz bis 3 GHz −40,0 dBm bis +1,0 dBm IM7585 1 MHz bis 1,3 GHz −40,0 dBm bis +1,0 dBm IM7583 1 MHz bis 600 MHz −40,0 dBm bis +1,0 dBm IM7581 100 kHz bis 300 MHz −40,0 dBm bis +7,0 dBm Detailed Product OverviewImpedance measurements up to 3 GHz enable analysis of RF components, for example in wireless communication applications. With a frequency range from 1 MHz to 3 GHz, the IM7587 supports characterization of components such as chip inductors, ferrite beads, filters, resonators and matching networks in RF circuit design. Measurement Performance and Analysis Functions With a basic accuracy of ±0.65% of impedance and ±0.38° of phase, the IM7587 is designed for precise impedance measurements up to 3 GHz. Typical repeatability of approximately ±0.07% supports reproducible measurement results under defined conditions across its entire frequency range. A typical measurement time of 0.5 ms enables fast frequency sweeps without compromising measurement stability. Test signal levels from −40.0 dBm to +1.0 dBm enable controlled excitation of devices under test. The analyzer supports LCR, sweep and continuous measurement modes and provides evaluation functions such as comparator and BIN judgment, as well as area, peak and spot analysis. All measurement settings and analysis functions are accessed directly via the integrated 8.4 inch color touchscreen. Standard interfaces include USB, LAN and EXT I/O, with optional RS-232C and GP-IB. For more advanced analysis, the IM7587 features an Equivalent Circuit Analysis function with five representative circuit models and automatic model selection based on measurement data. In addition to three-element R-L-C models, it also supports a four-element model designed for piezoelectric device analysis, enabling applications ranging from general component characterization to resonator evaluation. Test Head and Fixtures The IM7587 employs a compact, palm-sized test head connected to the main unit by a specified connection cable. It is available with 1 m or 2 m cable lengths, allowing users to balance measurement accuracy and installation flexibility. Placing the test head close to the device under test minimizes signal path length and reduces parasitic inductance and capacitance that would otherwise affect high-frequency measurements. This design supports stable and reproducible results up to 3 GHz while reducing bench space requirements in RF laboratories. For measurements of SMD components, the IM7587 is typically used in combination with the IM9201 SMD test fixture. The IM9201 is designed for six standard SMD package sizes from 0201 to 1210 and provides stable two-terminal bottom contacts at the component interface. The contact geometry is designed for measurements across the entire specified measurement frequency range. Components are positioned on defined contact pads using a stopper and pusher mechanism, ensuring correct alignment and repeatable placement. This reduces measurement variation and enables precise characterization of SMD RF components such as chip inductors, ferrite beads and filters. For stable mounting, the IM9201 test fixture is installed on the IM9200 test fixture stand. The stand provides a secure base and a defined mechanical alignment between the test head and the fixture and includes a magnifier to facilitate handling of small components. The IM9906 adapter is required to connect the 7 mm interface of the test fixture to the analyzer test head’s 3.5 mm connector. Calibration and Measurement Integrity The optional IM9905 calibration kit provides OPEN, SHORT and LOAD reference standards for correction of system-related measurement errors in high-frequency impedance measurements up to 3 GHz. The calibration compensates parasitic effects in the measurement path up to the defined reference plane, including the analyzer test head and connecting interfaces. The calibration standards are connected via the same IM9906 adapter used for test fixtures. Comprehensive contact check functions, including DCR testing, Hi-Z reject and waveform verification, are used to verify contact quality before and, if required, after measurement. This helps prevent invalid results caused by insufficient probe contact or unstable component placement. Developed and manufactured in Japan, the IM7587 is designed for stable measurement performance over time in measurement and test environments with high demands on long-term stability.